Structural and Mechanical Properties of Strontium Hexaferrite Powder

S. A. Gudkova, A. S. Chernukha, D. A. Vinnik, S. A. Gudkova

Abstract


Strontium hexaferrite is well-known material due to its application in microelectronics. This paper devoted to strontium hexaferrite single crystals obtained by the spontaneous crystallization technique with sodium based flux. SrFe12O19 crystals were grounded, pressed to the tablets and crystals cell parameters were measured by thermal X-ray diffraction technique. Thermal X-ray diffraction was carried out in the of 100 – 900 °C. Coefficient of thermal expansion calculated from the X-ray thermal diffraction data is in a good agreement with dilatometric measurements.

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References


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DOI: http://dx.doi.org/10.24892/RIJIE/20190105

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